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technical terms
- AESsearch for term
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Auger electron spectroscopy
- BFsearch for term
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Bright field image. In TEM, BF is formed using only (or mainly) transmitted beam.
- Cssearch for term
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Coefficient of spherical aberration. It also refer to spherical aberration itself, such as in Cs-correction.
- DFsearch for term
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Dark field image. In TEM, a DF image is formed using one or more diffracted beams.
- HAADFsearch for term
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High angle angular dark field image. It is a mode of STEM collecting only scattered electrons to high angles. The contrast is related to atomic number, Z. This imaging is also Z-contrast STEM.
- Z-contrast STEMsearch for term
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A STEM imaging mode where the detector collects high angle scattered electrons. The contrast is related to atomic number Z. High Z material gives brighter contrast.
- AFMsearch for term
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Atomic force microscope
- BSEDsearch for term
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Back scattered electron diffraction
- CBEDsearch for term
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Convergent beam electron diffraction
- CLsearch for term
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Cathodoluminescence
- Cryo-EMsearch for term
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Cryo-electron microscopy
- EDSsearch for term
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Energy dispersive spectroscopy. Also "EDXS"
- EDXsearch for term
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Energy dispersive X-ray spectroscopy. Also EDS
- EDXSsearch for term
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Energy dispersive x-ray spectroscopy. (Also "EDS")
- EELSsearch for term
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Electron energy loss spectroscopy/spectrum.
- emfocalsearch for term
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electron microscopy community center
- FIBsearch for term
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Focused Ion Beam. Generally referring to the technique or equipment to modify materials by ion beam milling.
- HAADFsearch for term
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High angle annular dark-field imaging (STEM)
- HREMsearch for term
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High-resolution electron microscopy
- HVEMsearch for term
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High voltage electron microscopy
- IVEMsearch for term
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Intermediate voltage electron microscopy
- LEEDsearch for term
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Low-energy electron diffraction
- MBEsearch for term
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Molecular beam epitaxy
- nanosearch for term
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short for nanometer: ten-millionth of a meter.
- PEELSsearch for term
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Parallel electron energy loss spectrometer. Normally refer to the equipment rather than the technology.
- RBSsearch for term
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Rutherford backscattering spectroscopy
- RHEEDsearch for term
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Reflection high energy electron diffraction
- SADsearch for term
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Select area diffraction
- SEMsearch for term
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Scanning electron microscopy
- SIMSsearch for term
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Secondary ion mass spectrometry
- SPMsearch for term
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Scanning probe microscopy
- STEMsearch for term
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Scanning transmission electron microscopy
- STMsearch for term
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Scanning tunneling microscopy
- TEMsearch for term
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Transmission Electron Microscopy.
- TOF-MSsearch for term
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Time-of-flight mass spectrometry
- WDSsearch for term
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Wavelength dispersive X-ray spectroscopy
- XAESsearch for term
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X-ray induced Auger electron spectroscopy
- XPSsearch for term
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X-ray photoelectron spectroscopy
- XRDsearch for term
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X-ray diffraction.